Ootsuka Fumio | Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

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概要

• Ootsuka Fumioの詳細を見る
• 同名の論文著者
• Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japanの論文著者

関連著者

• Sasaki Takaoki

  Semiconductor Leading Edge Technologies (selete) Aist

• HOSHI Takeshi

  Semiconductor Leading Edge Technologies Inc.

• YASUHIRA Mitsuo

  Semiconductor Leading Edge Technologies Inc.

• ARIKADO Tsunetoshi

  Semiconductor Leading Edge Technologies Inc.

• OZAKI Hiroji

  Semiconductor Leading Edge Technologies Inc.

• TOMIKAWA Mitsuhiro

  Semiconductor Leading Edge Technologies Inc.

• Ootsuka Fumio

  Semiconductor Leading Edge Technologies (selete) Aist

• Hoshi Takeshi

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Arikado Tsunetoshi

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Sasaki Takaoki

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Tomikawa Mitsuhiro

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Yasuhira Mitsuo

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Ootsuka Fumio

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Ozaki Hiroji

  Semiconductor Leading Edge Technologies Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

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著作論文

• Effect of Boron and Fluorine Incorporation in SiON Gate Insulator with Optimized Nitrogen Profile

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