Park Hokyung | Department of Materials Science and Engineering, Gwangju Institute of Science and Technology, #1, Oryong-dong, Buk-gu, Gwangju 500-712, Korea

スポンサーリンク

概要

関連著者

Park Hokyung
Department Of Materials Science And Engineering Gwangju Institute Of Science And Technology
Hwang Hyunsang
Department Of Materials Science And Engineering Gwangju Institute Of Science And Technology
CHOI Rino
SEMATECH
LEE Byoung
IBM Assignee
Hwang Hyunsang
Department of Materials Science and Engineering, Gwangju Institute of Science and Technology, #1, Oryong-dong, Buk-gu, Gwangju 500-712, Korea
Park Hokyung
Department of Materials Science and Engineering, Gwangju Institute of Science and Technology, #1, Oryong-dong, Buk-gu, Gwangju 500-712, Korea
Choi Rino
SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741, U.S.A.

著作論文

Improved Hot Carrier Reliability Characteristics of Metal Oxide Semiconductor Field Effect Transistors with High-$k$ Gate Dielectric by Using High Pressure Deuterium Post Metallization Annealing

スポンサーリンク