Putra Arifin | Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

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概要

• Putra Arifin Tamsirの詳細を見る
• 同名の論文著者
• Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japanの論文著者

関連著者

• Hiramoto Toshiro

  Institute Of Industrial Science The University Of Tokyo

• Putra Arifin

  Institute Of Industrial Science University Of Tokyo

• Kamohara Shiro

  Mirai-selete

• TSUNOMURA Takaaki

  MIRAI-Selete

• Nishida Akio

  MIRAI-Selete, 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Nishida Akio

  MIRAI, Semiconductor Leading Edge Technologies (Selete), Inc., 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Putra Arifin

  Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan

• Kamohara Shiro

  MIRAI-Selete, 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Takeuchi Kiyoshi

  MIRAI-Selete, 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• Tsunomura Takaaki

  MIRAI--Selete, Tsukuba, Ibaraki 305-8569, Japan

• Tsunomura Takaaki

  MIRAI-Selete, 16-1 Onogawa, Tsukuba, Ibaraki 305-8569, Japan

• HIRAMOTO Toshiro

  Institute Industrial Science, The University of Tokyo

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著作論文

• Impact of Oxide Thickness Fluctuation and Local Gate Depletion on Threshold Voltage Variation in Metal–Oxide–Semiconductor Field-Effect Transistors

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