Sato Soshi | Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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概要
- Sato Soshiの詳細を見る
- 同名の論文著者
- Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japanの論文著者
関連著者
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Yamada Keisaku
Graduate School Of Pure And Applied Sciences University Of Tsukuba
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Iwai Hiroshi
Frontier Collaborative Research Center Tokyo Institute Of Technology
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Kakushima Kuniyuki
Interdisciplinary Graduate School Of Science And Technology Tokyo Institute Of Technology
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Ohmori Kenji
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Yamada Keisaku
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Sato Soshi
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Kakushima Kuniyuki
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Ahmet Parhat
Frontier Collaborative Research Center Tokyo Institute Of Technology
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Natori Kenji
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Feng Wei
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Hettiarachchi Ranga
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Niwa Masaaki
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan
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Iwai Hiroshi
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
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Niwa Masaaki
Graduate School of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan
著作論文
- Experimental Characterization of Quasi-Fermi Potential Profile in the Channel of a Silicon Nanowire Field-Effect Transistor with Four-Terminal Geometry
- Advantages of Silicon Nanowire Metal--Oxide--Semiconductor Field-Effect Transistors over Planar Ones in Noise Properties