Nakamura Yoshiyuki | Nara Institute Of Science And Technology (naist):nec Electronics Corporation
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概要
関連著者
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FUJIWARA Hideo
Nara Institute of Science and Technology (NAIST)
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Fujiwara Hideo
Computer Design And Test Lab Nara Institute Of Science And Technology
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Savir Jacob
New Jersey Institute Of Technology (njit)
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Fujiwara Hideo
Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn
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NAKAMURA Yoshiyuki
Nara Institute of Science and Technology (NAIST)
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Fujiwara Hideo
Nara Inst. Of Sci. And Technol. (naist) Ikoma‐shi Jpn
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Nakamura Yoshiyuki
Nara Institute Of Science And Technology (naist):nec Electronics Corporation
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Fujiwara Hideo
Nara Institute Of Science And Technology:japan Science And Technology Agency Crest
著作論文
- Effect of BIST Pretest on IC Defect Level(Dependable Computing)
- Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST(Dependable Computing)