Hokari Yasuaki | Central Research Laboratories Nippon Electric Co. Ltd.

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概要

関連著者

著作論文

Video Defects in Charge-Coupled Image Sensors
228 by 248 Cell Charge-Coupled Image Sensor with Two-Level Overlapping Poly-Silicon Electrodes : B-4: IMAGING DEVICES
Secondary Defect Generation Suppression in Heavily Boron Implanted Silicon Wafers by HCl Oxidation
Secondary Defect Generation Suppression and Diffusivity Restraint in Heavily Phosphorus Implanted Silicon by HCI Oxidation

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