Fujita Shizuo | Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japan
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概要
- Fujita Shizuoの詳細を見る
- 同名の論文著者
- Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japanの論文著者
関連著者
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Fujita Shizuo
Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japan
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Kamada Yudai
Graduated School of Engineering, Kyoto University, Kyoto 615-8520, Japan
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HIRAMATSU Takahiro
Research Institute for Nano-devices, Kochi University of Technology
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Kimura Mutsumi
Department of Chemistry, Graduate School of Natural Science and Technology, Okayama University
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Furuta Mamoru
Research Institute For Nano-devices Kochi University Of Technology
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HIRAO Takashi
Research Institute, Kochi University of Technology
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Suzuki Norihito
Nippon Light Metal Company Ltd.
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Li Chaoyang
Research Institute For Nano-devices Kochi University Of Technology
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Arai Naoki
Nippon Light Metal Company Ltd.
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Fujita Shizuo
Kyoto Univ. Kyoto Jpn
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Oshima Takayoshi
Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-
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Okuno Takeya
Department of Electronic Science and Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-
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Ohira Shigeo
Nippon Light Metal Company, Ltd., Kambara, Shimizu-ku, Shizuoka 421-3291, Japan
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Okuno Takeya
Department Of Electronic Science And Engineering Kyoto University
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Ohira Shigeo
Nippon Light Metal Company Ltd.
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Oshima Takayoshi
Department Of Electronic Science And Engineering Kyoto University
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Wang Dapeng
Institute Of Radiation Medicine Chinese Academy Of Medical Sciences And Peking Union Medical College
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Kimura Mutsumi
Department of Electronics and Informatics, Ryukoku University, Otsu 520-2194, Japan
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Furuta Mamoru
Institute for Nanotechnology, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Shimakawa Shin-ichi
Institute for Nanotechnology, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Kawaharamura Toshiyuki
Institute for Nanotechnology, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Li Chaoyang
Institute for Nanotechnology, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Hirao Takashi
Institute for Nanotechnology, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Li Chaoyang
Research Institute for Nanodevices, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Yudai Kamada
Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japan
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Tokiyoshi Matsuda
Research Institute for Nanodevices, Kochi University of Technology, 185 Miyanokuchi, Tosayamada-cho, Kami, Kochi 782-8502, Japan
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Hiroshi Nitta
Research Institute for Nanodevices, Kochi University of Technology, 185 Miyanokuchi, Tosayamada-cho, Kami, Kochi 782-8502, Japan
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Mamoru Furuta
Research Institute for Nanodevices, Kochi University of Technology, 185 Miyanokuchi, Tosayamada-cho, Kami, Kochi 782-8502, Japan
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Takashi Hirao
Research Institute for Nanodevices, Kochi University of Technology, 185 Miyanokuchi, Tosayamada-cho, Kami, Kochi 782-8502, Japan
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Mamoru Furuta
Research Institute for Nanodevices, Kochi University of Technology, 185 Miyanokuchi, Kami, Kochi 782-8502, Japan
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Hirao Takashi
Research Institute for Nanodevices, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Takashi Hirao
Research Institute for Nanodevices, Kochi University of Technology, 185 Miyanokuchi, Kami, Kochi 782-8502, Japan
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Okuno Takeya
Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japan
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Oshima Takayoshi
Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japan
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Wang Dapeng
Institute for Nanotechnology, Kochi University of Technology, Kami, Kochi 782-8502, Japan
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Fujita Shizuo
Graduated School of Engineering, Kyoto University, Kyoto 615-8520, Japan
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Shinohara Daisuke
Graduate School of Engineering, Kyoto University, Katsura, Nishikyo-ku, Kyoto 615-8520, Japan
著作論文
- Positive Bias Instability of Bottom-Gate Zinc Oxide Thin-Film Transistors with a SiOx/SiNx-Stacked Gate Insulator
- Photo-Leakage Current of Zinc Oxide Thin-Film Transistors
- Vertical Solar-Blind Deep-Ultraviolet Schottky Photodetectors Based on $\beta$-Ga2O3 Substrates
- UV-B Sensor Based on a SnO2 Thin Film
- Photocurrent and Persistent Photoconductivity in Zinc Oxide Thin-Film Transistors under Ultraviolet-Light Irradiation
- Heteroepitaxy of Corundum-Structured $\alpha$-Ga2O3 Thin Films on $\alpha$-Al2O3 Substrates by Ultrasonic Mist Chemical Vapor Deposition