Okuno Yae | Central Research Laboratory Hitachi Ltd.
スポンサーリンク
概要
関連著者
-
Okuno Yae
Central Research Laboratory Hitachi Ltd.
-
TSUCHIYA Tomonobu
Central Research Laboratory, Hitachi, Ltd.
-
Tsuchiya Tomonobu
Central Research Laboratory Hitachi Ltd
-
Okuno Y
Lsi Manufacturing Technology Unit Wafer Process Engineering Development Division Renesas Technology
-
OKUNO Yae
Central Research Laboratory, Hitachi Ltd.,
-
Okuno Y
Central Research Laboratory Hitachi Ltd.
-
AOKI Masahiro
Central Research Laboratory, Hitachi, Ltd.
-
Uomi Kazuhisa
Central Research Laboratory, Hitachi Ltd.
-
Kitano T
Tokyo Electron Kyushu Ltd. Kumamoto Jpn
-
Tsuchiya T
Department Of Electronics Doshisha University
-
Kawano T
Osaka Univ. Osaka Jpn
-
UOMI Kazuhisa
The author is with Optical Device Department, Telecommunications System Group, Hitachi Ltd.
-
Kawano T
Tokyo Electron Kyushu Ltd. Kumamoto Jpn
-
Kitano T
Fundamental Research Laboratories Nec Corporation
-
Tsuchiya Tomonobu
Nagoya University
-
TANIWATARI Tsuyoshi
Central Research Laboratory, Hitachi Ltd.
-
KAWANO Toshihiro
Central Research Laboratory, Hitachi Ltd.
-
Uomi K
The Author Is With Optical Device Department Telecommunications System Group Hitachi Ltd.
-
Uomi Kazuhisa
Central Research Laboratory Hitachi Ltd.
-
Kawano Toshihiro
Central Research Laboratory Hitachi Ltd.
-
Taniwatari T
Hitachi Ltd. Tokyo
-
Taniwatari Tsuyoshi
Central Research Laboratory Hitachi Ltd.
-
Tamura Masao
Optoelectronic Research Laboratory:(present Address) Angstrom Technology Partnership
-
Aoki Masahiro
Central Research Laboratory Hitachi Ltd.
-
TSUCHIYA Tomonobu
Central Research Laboratory, Hitachi Ltd.,
著作論文
- Threading Dislocation Reduction in InP on GaAs by Thin Strained Interlayer and its Application to the Fabrication of 1.3-μm-Wavelength Laser on GaAs
- Direct Wafer Bonding Technique Aiming for Free-Material and Free-Orientation Integration of Semiconductor Materials
- Direct Wafer Bonding of a (001) InP-Based Strained Multiple Quantum Well on a (110) Si Substrate with a GaAs Buffer Layer, Aligning Cleavage Planes of InP and Si