TSUJIKAWA Shimpei | Renesas Technology Corp.
スポンサーリンク
概要
関連著者
-
Umeda Hiroshi
Renesas Technology Corp.
-
Yugami Jiro
Renesas Technology Corp.
-
TSUJIKAWA Shimpei
Renesas Technology Corp.
-
SHIGA Katsuya
Renesas Technology Corp.
-
Tsujikawa Shimpei
Renesas Technology Corp., 4-1 Mizuhara, Itami, Hyogo 664-0005, Japan
著作論文
- V_/E_-Driven Breakdown of Ultrathin SiON Gate Dielectrics in p-Type Metal Oxide Semiconductor Field Effect Transistors under Low-Voltage Inversion Stress
- $V_{\text{ox}}/E_{\text{ox}}$-Driven Breakdown of Ultrathin SiON Gate Dielectrics in p-Type Metal Oxide Semiconductor Field Effect Transistors under Low-Voltage Inversion Stress