Umeda Hiroshi | Renesas Technology Corp.

スポンサーリンク

概要

• 同名の論文著者
• Renesas Technology Corp.の論文著者

関連著者

• Umeda Hiroshi

  Renesas Technology Corp.

• Yugami Jiro

  Renesas Technology Corp.

• TSUJIKAWA Shimpei

  Renesas Technology Corp.

• SHIGA Katsuya

  Renesas Technology Corp.

• Tsujikawa Shimpei

  Renesas Technology Corp., 4-1 Mizuhara, Itami, Hyogo 664-0005, Japan

著作論文

• V_/E_-Driven Breakdown of Ultrathin SiON Gate Dielectrics in p-Type Metal Oxide Semiconductor Field Effect Transistors under Low-Voltage Inversion Stress
• $V_{\text{ox}}/E_{\text{ox}}$-Driven Breakdown of Ultrathin SiON Gate Dielectrics in p-Type Metal Oxide Semiconductor Field Effect Transistors under Low-Voltage Inversion Stress

スポンサーリンク