LAN Wen-How | Department of Electrical Engineering, National University of Kaohsiung
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概要
関連著者
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LAN Wen-How
Department of Electrical Engineering, National University of Kaohsiung
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HUANG Kuo-Chin
Department of Electrophysics, National Chiao Tung University
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LIU Ying
Institute for Microstructural Sciences, National Research Council, Montreal Rd.
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Wu Yewchung
Department Of Material Science And Engineering National Chiao Tung University
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Hsu Chin-Yuan
Department of Materials Science and Engineering, National Chiao Tung University, Hsinchu 300, Taiwan, R.O.C.
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HUANG Kai
Depart.of Metallurgy,Central South Univ.of Tch
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Su Y‐k
National Cheng Kung Univ. Tainan Twn
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CHANG Shoou-Jinn
Institute of Electro-Optical Science and Engineering, Center for Micro/Nano Science and Technology,
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SU Yan-Kuin
Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University
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KO Chih-Hsin
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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KUAN Ta-Ming
Institute of Microelectronics and Department of Electrical Engineering, National Cheng Kung Universi
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WEBB James
Institute for Microstructural Sciences, National Research Council
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Chang S‐j
Department Of Electrical Engineering National Cheng-kung University
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Chang Shoou-jinn
Institute Of Electro-optical Science And Engineering Center For Micro/nano Science And Technology Na
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Ko Chih-hsin
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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Kuan Ta-ming
Institute Of Microelectronics & Department Of Electrical Engineering National Cheng Kung Univers
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HUANG Kai
Department of Applied Chemistry, Saga University
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BARDWELL Jennifer
Institute for Microstructural Sciences, National Research Council, Montreal Rd.
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TANG Haipeng
Institute for Microstructural Sciences, National Research Council, Montreal Rd.
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LIN Web-Jen
Materials R&D Center, Chung Shan Institute of Science & Technology
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CHERNG Ya-Tung
Materials R&D Center, Chung Shan Institute of Science & Technology
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Tang Haipeng
Institute For Microstructural Sciences National Research Council Montreal Rd.
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Bardwell Jennifer
Institute For Microstructural Sciences National Research Council Montreal Rd.
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Webb James
Institute For Microstructural Sciences National Research Council
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Huang Kai
Department Of Applied Chemistry Saga University
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Su Yan-kuin
Institute Of Electro-optical Science And Engineering Advance Optoelectronics Technology Center Natio
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Huang Kuo-Chin
Department of Electrophysics, National Chiao Tung University, Hsinchu 300, Taiwan, Republic of China
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Lan Wen-How
Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung, Taiwan 811, R.O.C.
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Lan Wen-How
Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung 811, Taiwan, Republic of China
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Lan Wen-How
Department of Electrical Engineering, National University of Kaohsiung, Kaohsiung 811, Taiwan, R.O.C.
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Cherng Ya-Tung
Materials R&D Center, Chung Shan Institute of Science & Technology, Taoyuan, Taiwan 325, R.O.C.
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Chang Shoou-Jinn
Institute of Microelectronics & Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan 70101, R.O.C.
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Lin Web-Jen
Materials R&D Center, Chung Shan Institute of Science & Technology, Taoyuan, Taiwan 325, R.O.C.
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Webb James
Institute for Microstructural Sciences, National Research Council, Montreal Rd., Ottawa K1A 0R6, Canada
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Huang Kai
Department of Electrophysics, National Chiao Tung University, Hsinchu 300, Taiwan, Republic of China
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Bardwell Jennifer
Institute for Microstructural Sciences, National Research Council, Montreal Rd., Ottawa K1A 0R6, Canada
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Liu Ying
Institute for Microstructural Sciences, National Research Council, Montreal Rd., Ottawa K1A 0R6, Canada
著作論文
- High Optical-Gain AlGaN/GaN 2 Dimensional Electron Gas Photodetectors
- Inductively Coupled Plasma Reactive Ion Etching-Induced GaN Defect Studied by Schottky Current Transport Analysis
- Inductively Coupled Plasma Reactive Ion Etching-Induced GaN Defect Studied by Schottky Current Transport Analysis
- High Optical-Gain AlGaN/GaN 2 Dimensional Electron Gas Photodetectors
- Thermal Annealing Effect of Indium Tin Oxide Contact to GaN Light-Emitting Diodes
- Thermal Annealing Effect Between Ni Film and Mg-Doped GaN Layer
- Enhancement of Light Output Power of InGaN/GaN Multiple Quantum Well Light-Emitting Diodes by Titanium Dioxide Texturing