SAKAKIBARA Akira | The authors are with the School of Science and Engineering, Waseda University
スポンサーリンク
概要
関連著者
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Osaka T
Department Of Applied Chemistry School Of Science And Engineering Waseda University
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Osaka Tetsuya
Kagami Memorial Laboratory For Materials Science And Technology Waseda University:department Of Appl
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Koiwa Ichiro
Semiconductor Technology Laboratories Oki Electric Industry Co. Ltd.
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Koiwa Ichiro
Department Of Applied Chemistry Science And Engineering Waseda University
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Koiwa Ichiro
The Authors Are With Research And Development Group Oki Electric Industry Co. Ltd.
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Ono S
Saitama Univ. Urawa‐shi Jpn
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Ono S
Institute Of Industrial Science University Of Tokyo
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Osaka T
Graduate School Of Science And Engineering Waseda University
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Osaka Tetsuya
Department Of Applied Chemistry Science And Engineering Waseda University
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OSAKA Tetsuya
The authors are with the School of Science and Engineering, Waseda University
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ONO Sachiko
The authors are with Advanced Research Institute for Science and Engineering, Waseda University
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SAKAKIBARA Akira
The authors are with the School of Science and Engineering, Waseda University
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Osaka Tetsuya
Department Of Applied Chemistry Faculty Of Science And Engineering Waseda University
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Sakakibara A
Department Of Mechanical Engineering Okayama University
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Osaka Tetsuya
Graduate School Of Advanced Science And Engineering Waseda University
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Mita J
Research Laboratory Oki Electric Industry Corporation Ltd.
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Seki T
Tokyo Inst. Of Technol. Yokohama‐shi Jpn
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Kanehara T
Semiconductor Technology Laboratory Research And Development Group Oki Electric Industry Co. Ltd.
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KANEHARA Takao
The authors are with Microsystems Technology Laboratory, Oki Electric Industry Co., Ltd.
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MITA Juro
The authors are with Microsystems Technology Laboratory, Oki Electric Industry Co., Ltd.
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SEKI Tomonori
The authors are with the School of Science and Engineering, Waseda University
著作論文
- Crystallization Process of Sr_Bi_Ta_2O_9 Thin Films with Different Crystal Orientation Prepared by Chemical Liquid Deposition Using Alkoxide Precursor(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)
- Structural Defects in Sr_Bi_Ta_2O_9 Thin Film for Ferroelectric Memory(Special Issue on Advanced Memory Devices Using High-ε and Ferroelectric Films)