Hiura Y | Research Institute Of Electrical Communication Tohoku University:(present Address) Toshiba Corp.

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概要

• 同名の論文著者
• Research Institute Of Electrical Communication Tohoku University:(present Address) Toshiba Corp.の論文著者

関連著者

• Masu K

  Research Institute Of Electrical Communication Tohoku University

• Masu Kazuya

  Integrated Research Institute

• Masu Kazuya

  Research Institute Of Electrical Communication Tohoku University

• TSUBOUCHI Kazuo

  Research Institute of Electrical Communication, Tohoku University

• Mikoshiba N

  Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L

• Mikoshiba Nobuo

  Research Institute Of Electrical Communication Tohoku University:(present Address) Hewlett-packard L

• Mikoshiba Nobuo

  Research Institute Of Electrical Communication Tohoku University

• Tsubouchi K

  Tohoku Univ. Sendai Jpn

• Hiura Yohei

  Research Institute of Electrical Communication, Tohoku University

• Hiura Y

  Research Institute Of Electrical Communication Tohoku University:(present Address) Toshiba Corp.

• Tsubouchi Kazuo

  Research Institute Of Electrical Communicaiton Tohoku University

• Mikoshiba Nobuo

  Research Institute Of Electorical Communication Tohoku University

• TSUBOUCHI Kazuo

  Research Institute of Electric Communication (RIEC), Tohoku University

• Ohmi Tadahiro

  Department Of Electronic Engineering Graduate School Of Engineering Tohoku University

• Masu Kazuya

  東工大

• Matano Tatsuya

  Research Institute Of Electrical Communication Tohoku University

• Ohmi Tadahiro

  Department Of Electronic Engineering

• TANAKA Masanori

  Research Institute of Electrical Communication, Tohoku University

• HAYASHI Shigeki

  Shimadzu Corporation

• MARUI Takao

  Shimadzu Corporation

• TERAMOTO Akira

  Shimadzu Corporation

• KAJIKAWA Tetsuo

  Shimadzu Corporation

• SOEJIMA Hiroyoshi

  Shimadzu Corporation

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著作論文

• Single Crystallization of Aluminum on SiO_2 by Thermnal Annealing and Observation with Scanning μ-RHEED Microscope
• Development of Scanning μ-RHEED Microscopy for Imaging Polycrystal Grain Structure in LSI (SOLID STATE DEVICES AND MATERIALS 1)
• In Situ Observation of Electromigration in Cu Film Using Scanning μ-Reflection High-Energy Electron Diffraction Microscope

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