Kodera Masako | Process & Manufacturing Engineering Center Toshiba Corp.
スポンサーリンク
概要
関連著者
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Kodera Masako
Process & Manufacturing Engineering Center Toshiba Corp.
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Naka Nobuyuki
Horiba Ltd.
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MOCHIZUKI Yoshihiro
Ebara Research Corp.
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FUKUDA Akira
Ebara Research Corp.
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Tsuchiya Norihiko
Process And Manufacturing Engineering Center Toshiba Semiconductor Company
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Iguchi Tadashi
Process And Manufacturing Engineering Center Toshiba Semiconductor Company
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TAMURA Mizuki
Toshiba I. S. Corp.
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Kashiwagi Shinsuke
Horiba Ltd.
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Miyashita Naoto
Oita Operations Toshiba Corp.
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Kakinuma Shigeru
Horiba Ltd.
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Tsujimura Manabu
Ebara Corp.
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Matsui Yoshitaka
Yokkaitchi Operations Toshiba Corp.
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Hiyama Hirokuni
Ebara Corporation, Fujisawa, Kanagawa 251-8502, Japan
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TSUJIMURA Manabu
Ebara Corporation, Precision Machinery Company, Semiconductor Equipment Division
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KODERA Masako
Process and Manufacturing Engineering Center, Toshiba Semiconductor Company
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HIYAMA Hirokuni
Ebara Research Corp.
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KAKINUMA Shigeru
Horiba, Ltd.
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KASHIWAGI Shinsuke
Horiba, Ltd.
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MATSUI Yoshitaka
Yokkaitchi Operations, Toshiba Corp.
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MIYASHITA Naoto
Oita Operations, Toshiba Corp.
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Naka Nobuyuki
HORIBA, Ltd., 2 Miyanohigashi, Kisshoin, Minami-ku, Kyoto 601-8510, Japan
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Iguchi Tadashi
Process and Manufacturing Engineering Center, Toshiba Semiconductor Company, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan
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Kashiwagi Shinsuke
HORIBA, Ltd., 2 Miyanohigashi, Kisshoin, Minami-ku, Kyoto 601-8510, Japan
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Kakinuma Shigeru
HORIBA, Ltd., 2 Miyanohigashi, Kisshoin, Minami-ku, Kyoto 601-8510, Japan
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Kodera Masako
Process and Manufacturing Engineering Center, Toshiba Semiconductor Company, 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan
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Tamura Mizuki
Toshiba I. S. Corp., 8 Shinsugita-cho, Isogo-ku, Yokohama 235-8522, Japan
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Tsujimura Manabu
Ebara Corp., 4-2-1 Honfujisawa, Fujisawa, Kanagawa 251-8502, Japan
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Hiyama Hirokuni
Ebara Research Corp., 4-2-1 Honfujisawa, Fujisawa, Kanagawa 251-8502, Japan
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Mochizuki Yoshihiro
Ebara Research Corp., 4-2-1 Honfujisawa, Fujisawa, Kanagawa 251-8502, Japan
著作論文
- Shear Stress Analyses in Chemical Mechanical Planarization Processing with Cu/porous low-k Structure
- Nano-Scale Stress Field Evaluation with Shallow Trench Isolation Structure Assessed by Cathodoluminescence, Raman Spectroscopy, and Finite Element Method Analyses
- Wet cleaning processing of VLSI devices by functional waters (電子デバイス)
- Nanoscale Stress Field Evaluation with Shallow Trench Isolation Structure Assessed by Cathodoluminescence Spectroscopy, Raman Spectroscopy, and Finite Element Method Analyses
- Wet Cleaning Processing of VLSI Devices by Functional Waters
- Shear Stress Analyses in Chemical Mechanical Planarization with Cu/Porous Low-$k$ Structure