Shin Yu-gyun | Memory Division Samsung Electronics Co.
スポンサーリンク
概要
関連著者
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Chung U-in
Memory Division Samsung Electronics Co.
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Moon Joo-tae
Memory Division Samsung Electronics Co.
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Shin Yu-gyun
Memory Division Samsung Electronics Co.
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Moon J‐t
Process Development Team Memory Division Semiconductor Business Samsung Electronics Co. Ltd.
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Moon Joo-tae
Semiconductor R&d Center Samsung Electronics Co. Ltd.
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Lee Deok-hyung
Process Development Team Memory Division Semiconductor Business Samsung Electronics Co. Ltd.
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Lee Jong-Wook
Memory Division, Samsung Electronics Co.
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Lee Deok-Hyung
Memory Division, Samsung Electronics Co.
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Shin Yu-Gyun
Memory Division, Samsung Electronics Co.
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Chung U-In
Memory Division, Samsung Electronics Co.
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Moon Joo-Tae
Memory Division, Samsung Electronics Co.
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Moon Joo
Process Development Team Memory Division Samsung Electronics Co. Ltd.
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Lee Jae-mun
Division Of Hematolgoy Catholic Hematopoietic Stem Cell Transplantation Center College Of Medicine T
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Lee Jong-wook
Process Development Team Memory Division Semiconductor Business Samsung Electronics Co. Ltd.
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Chung U‐i
Process Development Team Memory Division Semiconductor Business Samsung Electronics Co. Ltd.
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Chung U-in
Semiconductor R & D Center Samsung Electronics Co.ltd.
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Lee Deok-hyung
Memory Division Samsung Electronics Co.
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Lee Jong-wook
Silicon Systems Research Labs.
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Oh Jeong-hee
Semiconductor Research Division Hyundai Electronics Industries Co. Ltd.
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Kim Hyung-ki
Semiconductor Research Division Hyundai Electronics Industries Co. Ltd.
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Oh Min-rok
Semiconductor Research Division Hyundai Electronics Industries Co. Ltd.
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Koh Yo-hwan
Semiconductor Advanced Research Division Hyundai Electronics Industries Co. Ltd
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Lee Jong-Wook
Semicoductor Research Division, Hyundai Electronics Industries Co., Ltd.
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Nam Myung-Hee
Semicoductor Research Division, Hyundai Electronics Industries Co., Ltd.
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Yang Ji-Woon
Semicoductor Research Division, Hyundai Electronics Industries Co., Ltd.
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Lee Won-Chang
Semicoductor Research Division, Hyundai Electronics Industries Co., Ltd.
著作論文
- 3D Cell Structure for Low Power and High Performance DRAM : FCAT (Fin-Channel-Array Transistor)(Session A1 Si Novel Device and Process)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- 3D Cell Structure for Low Power and High Performance DRAM : FCAT (Fin-Channel-Array Transistor)(Session A1 Si Novel Device and Process)(2004 Asia-Pacific Workshop on Fundamentals and Application of Advanced Semiconductor Devices (AWAD 2004))
- Effects of buried oxide stress on thin-film silicon-on-insulator metal-oxide-semiconductor field-effect-transistor