Kimura T | Components Division Oki Electric Industry Co. Ltd.

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著作論文

PLL Timing Design Techniques for Large-Scale, High-Speed, Low-Power, Low-Cost SRAMs
Shift in Threshold Voltage and Schottky Barrier Height of Molybdenum Gate Gallium Arsenide Field Effect Transistors after High Forward Gate Current Test
The Recovery Process of RIE-Damage in InGaAs/AlGaAs PHEMT Using Recombination Enhanced Defect Reaction (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000)
Gate Orientation Dependence of InGaAs/AlGaAs High Electron Mobility Transistors
Schottky Characteristics of InAlAs Grown by Metal-Organic Chemical Vapor Deposition
Development of the High Aspect-Ratio Y-Shaped Gate Process for HEMT
The Change of Mo/GaAs Schottky Characteristics by the Forward Gate Current

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