Chang Chia-wen | Institute Of Electronics National Chiao-tung University
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概要
関連著者
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Chang Chia-wen
Institute Of Electronics National Chiao-tung University
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Lei Tan-fu
Institute And Department Of Electronics Engineering National Chiao Tung University
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Lee Jam-wem
Taiwan Semiconductor Manufacturing Company
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LEI Tan-Fu
Institute of Electronics, National Chiao Tung University
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Lei Tan-fu
Institute Of Electronics National Chiao-tung University
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CHANG Chia-Wen
Institute of Electronics, National Chiao-Tung University
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Huang Jiun-jia
Institute Of Electronics National Chiao-tung University
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Deng Chih-kang
Institute Of Electronics National Chiao-tung University
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Chang Che-Lun
Institute of Electronics, National Chiao Tung University, Hsinchu 30010, Taiwan
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CHANG Che-Lun
Institute of Electronics, National Chiao-Tung University
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HUANG Jiun-Jia
Institute of Electronics, National Chiao-Tung University
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CHANG Hong-Ren
Institute of Electronics, National Chiao-Tung University
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Chang Hong-ren
Institute Of Electronics National Chiao-tung University
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Liao Ta-chuan
Institute Of Electronics National Chiao Tung University
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Deng Chih-Kang
Institute of Electronics, National Chiao Tung University, Hsinchu 30010, Taiwan
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Liao Ta-Chuan
Institute of Electronics, National Chiao Tung University, Hsinchu 30010, Taiwan
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Lei Tan-Fu
Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan
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Lei Tan-Fu
Institute of Electronics, National Chiao Tung University, Hsinchu 30010, Taiwan
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Deng Chih-Kang
Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan
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Wang Tong-Yi
Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan
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Huang Jiun-Jia
Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan
著作論文
- A Novel Process-Compatible Floating Channel Crystallization Technique to Fabricate High-Performance Poly-Si TFTs
- Improvement of Electrical Characteristics for Novel Fluorine-Incorporated Poly-Si TFTs with TiN Gate Electrode and Pr_2O_3 Gate Dielectric
- Electrical Enhancement of Polycrystalline Silicon Thin-Film Transistors Using Fluorinated Silicate Glass Passivation Layer
- High-Performance Solid-Phase Crystallized Polycrystalline Silicon Thin-Film Transistors with Floating-Channel Structure