Huang Jiun-jia | Institute Of Electronics National Chiao-tung University

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概要

• HUANG Jiun-Jiaの詳細を見る
• 同名の論文著者
• Institute Of Electronics National Chiao-tung Universityの論文著者

関連著者

• Huang Jiun-jia

  Institute Of Electronics National Chiao-tung University

• Lei Tan-fu

  Institute And Department Of Electronics Engineering National Chiao Tung University

• Chang Chia-wen

  Institute Of Electronics National Chiao-tung University

• Lee Jam-wem

  Taiwan Semiconductor Manufacturing Company

• LEI Tan-Fu

  Institute of Electronics, National Chiao Tung University

• Lei Tan-fu

  Institute Of Electronics National Chiao-tung University

• CHANG Chia-Wen

  Institute of Electronics, National Chiao-Tung University

• HUANG Jiun-Jia

  Institute of Electronics, National Chiao-Tung University

• CHANG Hong-Ren

  Institute of Electronics, National Chiao-Tung University

• Chang Hong-ren

  Institute Of Electronics National Chiao-tung University

• Deng Chih-kang

  Institute Of Electronics National Chiao-tung University

• Chien Chao-hsin

  Institute Of Electronics National Chiao-tung University

• Yang Shao-Ming

  Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan

• Lei Tan-Fu

  Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan

• Deng Chih-Kang

  Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan

• Chien Chao-Hsin

  Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan

• Wang Tong-Yi

  Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan

• Huang Jiun-Jia

  Institute of Electronics, National Chiao Tung University, 1001 Ta-Hsueh Road, Hsinchu 30050, Taiwan

• Huang Jiun-Jia

  Institute of Electronics, National Chiao Tung University, Hsinchu 300, Taiwan

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著作論文

• Improvement of Electrical Characteristics for Novel Fluorine-Incorporated Poly-Si TFTs with TiN Gate Electrode and Pr_2O_3 Gate Dielectric
• Electrical Enhancement of Polycrystalline Silicon Thin-Film Transistors Using Fluorinated Silicate Glass Passivation Layer
• Nonvolatile Flash Memory Devices Using CeO2 Nanocrystal Trapping Layer for Two-Bit per Cell Applications

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