Ohnakado Takahiro | Advanced Technology R&d Center Mitsubishi Electric Corporation
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概要
関連著者
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Ohnakado Takahiro
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Sugahara Kazuyuki
Advanced Technology R&d Center Mitsubishi Electric Corporation
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YAMAKAWA Satoshi
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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NISHIKAWA Kazuyasu
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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MURAKAMI Takaaki
Advanced Technology R&D Center, Mitsubishi Electric Corporation
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Suematsu Noriharu
Information Technology R & D Center Mitsubishi Electric Corporation
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Ajika N
Memory Ic Division Mitsubishi Electric Corporation
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Tomisawa Jun
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Oomori Tatsuo
Advanced Technology R&d Center Mitsubishi Electric Corp.
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AJIKA Natsuo
Memory IC Division, Mitsubishi Electric Corporation
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Furukawa Akihiko
Advanced Technology R & D Center Mitsubishi Electric Corporation
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Hashizume Yasushi
Advanced Technology R&d Center
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Oomori Tatsuo
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Furukawa Akihiko
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Sugahara Kazuyuki
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Murakami Takaaki
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Tomisawa Jun
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Hashizume Yasushi
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Nishikawa Kazuyasu
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
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Yamakawa Satoshi
Advanced Technology R&D Center, Mitsubishi Electric Corporation, 8-1-1 Tsukaguchi-Honmachi, Amagasaki, Hyogo 661-8661, Japan
著作論文
- Review of Device Technologies of Flash Memories(Special Issue on Nonvolatile Memories)
- P-channel DINOR Flash Memory with Band-to-Band Tunneling Induced Hot Electron Programming
- An Electrostatic-Discharge (ESD) Protection Device with Low Parasitic Capacitance Utilizing a Depletion-Layer-Extended Transistor (DET) for RF CMOS ICs