P-channel DINOR Flash Memory with Band-to-Band Tunneling Induced Hot Electron Programming

スポンサーリンク

概要

• 論文の詳細を見る
• 1999-09-20

著者

• Ohnakado Takahiro

  Advanced Technology R&d Center Mitsubishi Electric Corporation

関連論文

• Review of Device Technologies of Flash Memories(Special Issue on Nonvolatile Memories)
• P-channel DINOR Flash Memory with Band-to-Band Tunneling Induced Hot Electron Programming
• An Electrostatic-Discharge (ESD) Protection Device with Low Parasitic Capacitance Utilizing a Depletion-Layer-Extended Transistor (DET) for RF CMOS ICs

スポンサーリンク