YU Thomas | Computer Design and Test Lab, Nara Institute of Science and Technology

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概要

• YU Thomas Edisonの詳細を見る
• 同名の論文著者
• Computer Design and Test Lab, Nara Institute of Science and Technologyの論文著者

関連著者

• Fujiwara Hideo

  Computer Design And Test Lab Nara Institute Of Science And Technology

• Fujiwara Hideo

  Nara Institute Of Science And Technology:japan Science And Technology Agency Crest

• YU Thomas

  Computer Design and Test Lab, Nara Institute of Science and Technology

• Yu Thomas

  Computer Design And Test Lab Nara Institute Of Science And Technology

• Yoneda Tomokazu

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

• Fujiwara Hideo

  Nara Inst. Sci. And Technol. (naist) Ikoma‐shi Jpn

• Fujiwara Hideo

  Graduate School Of Information Science Nara Institute Of Science And Technology

• YONEDA Tomokazu

  Graduate School of Information Science, Nara Institute of Science and Technology

• Yoneda Tomokazu

  Graduate School Of Information Of Science Nara Institute Of Science And Technology

• YU Thomas

  Graduate School of Information Science, Nara Institute of Science and Technology

• Fujiwara Hideo

  Graduate School Of Information Of Science Nara Institute Of Science And Technology

• Chakrabarty Krishnendu

  Electrical And Computer Engineering Duke University

• ZHAO Danella

  The Center For Advanced Computer Studies, University of Louisiana at Lafayette

• Zhao Danella

  The Center For Advanced Computer Studies University Of Louisiana At Lafayette

• Chakrabarty Krishnendu

  Department Of Electrical And Computer Engineering Duke University

• Yoneda Tomokazu

  Computer Design And Test Lab Nara Institute Of Science And Technology

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著作論文

• Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips
• Effective Domain Partitioning for Multi-Clock Domain IP Core Wrapper Design under Power Constraints
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (システムLSI設計技術・デザインガイア2007--VLSI設計の新しい大地を考える研究会)
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (ディペンダブルコンピューティング)
• Thermal-aware test scheduling with cycle-accurate power profiles and test partitioning (VLSI設計技術)
• Power constrained IP core wrapper design with partitioned clock domains (回路とシステム)
• Power constrained IP core wrapper design with partitioned clock domains (VLSI設計技術)
• Power constrained IP core wrapper design with partitioned clock domains (信号処理)

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