KANDA Kouichi | Fujitsu Laboratories LTD

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概要

• 同名の論文著者
• Fujitsu Laboratories LTDの論文著者

関連著者

• KANDA Kouichi

  Fujitsu Laboratories LTD

• 桜井 貴康

  東京大学

• SAKURAI Takayasu

  Institute of Industrial Science, The University of Tokyo

• 桜井 貴康

  Institute Of Industrial Science University Of Tokyo

• Min Kyeong‐sik

  Korea Maritime Univ. Busan Kor

• Min K‐s

  Korea Maritime Univ.

• Kawaguchi H

  Institute Of Industrial Science The University Of Tokyo:(present Office)kobe University

• KAWAGUCHI Hiroshi

  Institute of Industrial Science, the University of Tokyo

• Sakurai Takayasu

  Institute Of Industrial Science & Center For Collaborative Research The University Of Tokyo

• Kawaguchi Hiroshi

  Institute Of Industrial Science The University Of Tokyo:(present Office)kobe University

• Kawaguchi H

  Univ. Tokyo Tokyo Jpn

• Kanda Kouichi

  Institute Of Industrial Science University Of Tokyo:system Lsi Development Laboratories Fujitsu Labo

• Saliba Fayez

  School Of Engineering The University Of Tokyo:(present Office)takumi Technology

• Kawaguchi Hiroshi

  Institute Of High Speed Mechanics Tohoku University

• Min Kyeong-sik

  Institute Of Industrial Science University Of Tokyo

• TAMURA Hirotaka

  Fujitsu Laboratory Ltd.

• HAMADA Takayuki

  Fujitsu Laboratory Ltd.

• Tamura Hirotaka

  Fujitsu Laboratories Ltd.

• ROBERTSALIBA Fayez

  Institute of Industrial Science, University of Tokyo

• 川口 博

  Institute of Industrial Science, University of Tokyo

• Robert Saliba

  Institute Of Industrial Science University Of Tokyo

• 川口 博

  Institute of Industrial Science, the University of Tokyo:(Present office)Kobe University

• Kuroda Tadahiro

  Keio Univ.

• OGAWA Junji

  Fujitsu Laboratory Ltd.

• SHIBASAKI Takayuki

  Keio University

• YAMAGUCHI Hisakatsu

  Fujitsu Laboratories LTD

• 神田 浩一

  Institute Of Industrial Science University Of Tokyo

• Kim Dong

  School Of Electrical And Electronic Engineering Chung-ang Univ.

• KURODA Tadahiro

  Keio University, Dept. of Electronics and Electrical Engineering

• KIBUNE Masaya

  Fujitsu Laboratory Ltd.

• Min Kyeong

  Institute Of Industrial Science University Of Tokyo:school Of Electrical Engineering Kookmin Univers

• KIM Daejeong

  School of Electrical Engineering, Kook-min University

• GOTOH Kohtaroh

  Fujitsu Laboratories Ltd.

• Kim Dong

  School Of Electrical And Electronic Engineering At Yonsei University

• Kim Daejeong

  Kookmin Univ. Seoul Kor

• Kim Daejeong

  School Of Electrical Engineering Kookmin University

• INAGAKI Kenichi

  the University of Tokyo

• INAGAKI Kenichi

  Institute of Industrial Science, University of Tokyo

• SALIBA Fayez

  Institute of Industrial Science, University of Tokyo

• CHOI Hoon

  School of Electrical Engineering, Kookmin University

• CHOI Hyun

  School of Electrical Engineering, Kookmin University

• Kim Daejeong

  School Of Electrical Engineering Kook-min University

• ISHIDA Hideki

  Fujitsu Laboratories, LTD.

• Choi Hoon

  School Of Electrical Engineering Kookmin University

• Ishida Hideki

  Fujitsu Laboratories Ltd.

• Choi Hyun

  School Of Electrical Engineering Kookmin University

• Yamamoto Takuji

  Fujitsu Laboratory Ltd.

• Takatsu Keita

  Keio University

• DOI Yoshiyasu

  Fujitsu Laboratory Ltd.

• KANDA Koichi

  Fujitsu Laboratory Ltd.

• SHIBASAKI Takayuki

  Fujitsu Laboratory Ltd.

• Kim Dong

  School of Clinical Sciences, University of Bristol

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著作論文

• 18-GHz Clock Distribution Using a Coupled VCO Array(Analog and Communications,Low-Power, High-Speed LSIs and Related Technologies)
• Row-by-Row Dynamic Source-Line Voltage Control (RRDSV) Scheme for Two Orders of Magnitude Leakage Current Reduction of Sub-1-V-V_SRAM's(Electronic Circuits)
• サブ1VのSRAMにおけるリークを2桁以上削減する新手法RRDSV(システムLSIの応用とその要素技術,専用プロセッサ,プロセッサ,DSP,画像処理技術,及び一般)
• サブ1VのSRAMにおけるリークを2桁以上削減する新手法RRDSV(システムLSIの応用とその要素技術,専用プロセッサ,プロセッサ,DSP,画像処理技術,及び一般)
• サブ1VのSRAMにおけるリークを2桁以上削減する新手法RRDSV(システムLSIの応用とその要素技術,専用プロセッサ,プロセッサ,DSP,画像処理技術,及び一般)
• Circuits for CMOS High-Speed I/O in Sub-100nm Technologies (Interface and Interconnect Techniques, VLSI Design Technology in the Sub-100nm Era)
• A 60-GHz Injection-Locked Frequency Divider Using Multi-Order LC Oscillator Topology for Wide Locking Range

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