Bolotov Leonid | Mirai-advanced Semiconductor Research Center (asrc)
スポンサーリンク
概要
関連著者
-
Bolotov Leonid
Mirai-advanced Semiconductor Research Center (asrc)
-
Kanayama Toshihiko
Mirai-advanced Semiconductor Research Center (asrc)
-
Nishizawa Masayasu
Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Science And
-
Bolotov Leonid
Mirai Project Advanced Semiconductor Research Center National Institute Of Advanced Industrial Scien
-
NISHIZAWA Masayasu
MIRAI Project, Advanced Semiconductor Research Center (ASRC), National Institute of Advanced Industr
-
Kanayama Toshihiko
Mirai Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industrial Scienc
-
Nishizawa Masayasu
Mirai Project Advanced Semiconductor Research Center (asrc) National Institute Of Advanced Industria
-
Bolotov Leonid
Nanodevice Innovation Research Center, National Institute of Advanced Industrial Science and Technology
-
Nishizawa Masayasu
Nanodevice Innovation Research Center, National Institute of Advanced Industrial Science and Technology
-
Kanayama Toshihiko
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
-
Bolotov Leonid
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
-
NISHIZAWA Masayasu
Nanodevice Innovation Research Center, National Institute of Advanced Industrial Science and Technol
-
Nishizawa Masayasu
Nanodevice Innovation Research Center National Institute Of Advanced Industrial Science And Technolo
著作論文
- Dopant-atom distribution measurement at p-n junctions on wet-prepared Si(111):H surfaces by scanning tunneling microscopy
- Scanning Tunneling Microscopy Observation of Individual Boron Dopant Atoms beneath Si(001)-2×1 Surfaces
- Two dimensional dopant profiling by scanning tunneling microscopy (小特集 半導体産業で利用される走査プローブ顕微鏡技術)
- Two Dimensional Dopant Profiling by Scanning Tunneling Microscopy