Sugiura Jun | Device Development Center Hitachi Ltd.
スポンサーリンク
概要
関連著者
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Sugiura Jun
Device Development Center Hitachi Ltd.
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Ogasawara Makoto
Device Development Center Hitachi Ltd.
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Tanigawa Shoichiro
Institute Of Applied Physics University Of Tsukuba
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Uedono Akira
Institute of Applied Physics and Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8573, Japan
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TANIGAWA Shoichiro
Institute of Materials Science, The University of Tsukuba
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UEDONO Akira
Institute of Materials Science, University of Tsukuba
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Ogasawara M
Hitachi Ltd. Tokyo Jpn
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SUGIURA Jun
Device Development Center, Hitachi Ltd.
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OGASAWARA Makoto
Device Development Center, Hitachi Ltd.
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Shouguchi Junko
Department Of Life Science Faculty Of Bioscience And Biotechnology Tokyo Institute Of Technology
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Ogasawara M
Pioneer Corp. Saitama Jpn
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Kametani Hitoshi
General Research Laboratory Mitubishi Electric Corporation
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KONDO Hitoshi
Institute of Materials Science,University of Tsukuba
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WEI Long
Institute of Materials Science, University of Tsukuba
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DOSHO Chisei
Institute of Materials Science, University of Tsukuba
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Wei Long
Institute Of Materials Science University Of Tsukuba
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Dosho Chisei
Institute Of Materials Science University Of Tsukuba
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Kondo H
Nikon Corp.
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Kondo Hitoshi
Institute Of Materials Science University Of Tsukuba
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UEDONO Akira
Institute of Materials Science, University of Tsukuba:(Present address)Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo
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UEDONO Akira
Institute of Materials Science, University of Tsukuba:(Present address)Department of Physics, Yokohama City University
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TANIGAWA Shoichiro
Institute of Materials Science, University of Tsukuba
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KONDO Hitoshi
Institute of Materials Science, University of Tsukuba
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Uedono Akira
Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305
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Tanigawa Shoichiro
Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305
著作論文
- Defect Production in Phosphorus Ion-Implanted SiO_2(43 nm)/Si Studied by a Variable-Energy Positron Beam
- Vacancy-Type Defects in As^+-Implanted SiO_2(43 nm)/Si Proved with Slow Positrons
- A Study of Vacancy-Type Defects in B+-Implanted SiO2/Si by a Slow Positron Beam