Boeuf Frederic | Stmicroelectronics
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概要
関連著者
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Skotnicki Thomas
Stmicroelectronics
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Boeuf Frederic
Stmicroelectronics
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Payet Fabrice
Stmicroelectronics
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Meziani Yahya
Riec Tohoku University:groupe D'etude Des Semiconducteurs Universite Montpellier 2
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Pouydebasque Arnaud
Philips Semiconductors
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DUMONT Benjamin
STMicroelectronics
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MILESI Frederic
Ion Beam Services, ZI Peynier-Rousset, rue Gaston Imbert prolongee
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SOUIFI Kader
LPM-INSA de Lyon
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Milesi Frederic
Ion Beam Services Zi Peynier-rousset Rue Gaston Imbert Prolongee
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Knap Wojciech
Ges-umr 5650 Cnrs Universite Montpellier 2
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MEZIANI Yahya
RIEC, Tohoku University
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LUSAKOWSKI Jerzy
Groupe d'Etude des Semiconducteurs, Universite Montpellier 2
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DYAKONOVA Nina
Groupe d'Etude des Semiconducteurs, Universite Montpellier 2
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KNAP Wojciech
Groupe d'Etude des Semiconducteurs, Universite Montpellier 2
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SELIUTA Dalius
Semiconductor Physics Institute
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SIRMULIS Edmundas
Semiconductor Physics Institute
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DEVENSON Jan
Semiconductor Physics Institute
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VALUSIS Gintaras
Semiconductor Physics Institute
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SZCZAP Melanie
L2MP
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CAVASSILAS Nicolas
L2MP
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Lusakowski Jerzy
Ges-umr 5650 Cnrs Universite Montpellier 2:institute Of Experimental Physics Warsaw University
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DYAKONOVA Nina
GES-UMR 5650 CNRS, Universite Montpellier 2
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Dyakonova Nina
Ges-umr 5650 Cnrs Universite Montpellier 2
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Borot Bertrand
STMicroelectronics, 850 rue Jean Monnet, 38960 Crolles Cedex, France
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Ghibaudo Gerard
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Sellier Manuel
STMicroelectronics, 850 rue Jean Monnet, 38960 Crolles Cedex, France
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Clerc Raphael
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Ferrier Marlene
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Pananakakis Georges
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Payet Fabrice
STMicroelectronics, 850 rue Jean Monnet, 38960 Crolles Cedex, France
著作論文
- Improvement of Bulk CMOS Electrostatic Integrity using Germanium and Carbon co-implantation
- Is a "Power Optimized" Roadmap Realistic for High Performance Applications?
- Non Resonant Response to Terahertz Radiation by Submicron CMOS Transistors(THz Devices,Heterostructure Microelectronics with TWHM2005)
- Analytical Model for Phonon-Limited Mobility in n-MOS Inversion Layers on Arbitrarily Oriented and Strained Si Surfaces
- Using Model for Assessment of Complementary Metal Oxide Semiconductor Technology and Roadmaps as a Pre-Simulation Program with Integrated Circuit Emphasis Model Generator for Early Technology and Circuit Simulation
- Analytical Compact Model for Quantization in Undoped Double-Gate Metal Oxide Semiconductor Field Effect Transistors and Its Impact on Quasi-Ballistic Current