Ghibaudo Gerard | IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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概要
関連著者
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Ghibaudo Gerard
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Ghibaudo Gerard
Imep Minatec-inpg
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GHIBAUDO Gerard
IMEP, Minatec-INPG
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Lee Chul
National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering P
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Lee Jungil
Nano Device Research Center, Korea Institute of Science and Technology
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Yi Gyu-chul
National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering P
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Yi Gyu-chul
National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering
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Yu Byung-yong
Division Of Materials Research Korea Institute Of Science And Technology
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Lee Jungil
Nano Device Research Center Kist
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Kim Gyu-tae
School Of Electrical Engineering Korea University
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Skotnicki Thomas
Stmicroelectronics
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Boeuf Frederic
Stmicroelectronics
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ZAFARI Leily
IMEP, MINATEC-INPG
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JOMAAH Jalal
IMEP, MINATEC-INPG
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Jomaah Jalal
Imep Minatec-inpg
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Zafari Leily
Imep Minatec-inpg
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Clerc Raphael
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Ferrier Marlene
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Pananakakis Georges
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
著作論文
- Low-frequency noise characterizations of back-gate ZnO nanorod field-effect transistor structure (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Low-frequency noise characterizations of back-gate ZnO nanorod field-effect transistor structure (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Impact of Silicon Film Thickness on LF Noise in SOI Devices
- Analytical Compact Model for Quantization in Undoped Double-Gate Metal Oxide Semiconductor Field Effect Transistors and Its Impact on Quasi-Ballistic Current