Kim Gyu-tae | School Of Electrical Engineering Korea University
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概要
関連著者
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Kim Gyu-tae
School Of Electrical Engineering Korea University
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Lee Chul
National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering P
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Ghibaudo Gerard
Imep Minatec-inpg
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Lee Jungil
Nano Device Research Center, Korea Institute of Science and Technology
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Yi Gyu-chul
National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering P
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Yi Gyu-chul
National Cri Center For Semiconductor Nanorods And Department Of Materials Science And Engineering
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Yu Byung-yong
Division Of Materials Research Korea Institute Of Science And Technology
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Lee Jungil
Nano Device Research Center Kist
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GHIBAUDO Gerard
IMEP, Minatec-INPG
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Ghibaudo Gerard
IMEP, 23 rue des Martyrs, 38000 Grenoble, France
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Yee Seong-Min
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Choi Jae-Wan
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Kim Gyu-Tae
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
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Choi Soo-Han
CAE Team, Semiconductor R&D Center, Samsung Electronics, San #16, Banwol-dong, Hwasung, Gyeonggi-do 445-701, Korea
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Cho Young-Seung
Technology Development Team, Semiconductor R&D Center, Samsung Electronics, San #16, Banwol-dong, Hwasung, Gyeonggi-do 445-701, Korea
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Ji Hyun-Jin
School of Electrical Engineering, Korea University, Anam, Seongbuk, Seoul 136-701, Korea
著作論文
- Low-frequency noise characterizations of back-gate ZnO nanorod field-effect transistor structure (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Low-frequency noise characterizations of back-gate ZnO nanorod field-effect transistor structure (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Smart Gas Sensor and Noise Properties of Single ZnO Nanowire