Lee J | National Nano Device Lab. Hsinchu Twn
スポンサーリンク
概要
関連著者
-
Park J
Memory R&d Center Hyundai Electronics Industries Co. Ltd.
-
Park J
Hyundai Electronics Industries Co. Ltd. Kyoungki‐do Kor
-
Lee J
Department Of Electronic Engineering National Chiao Tung University
-
Park Jin
Memory R&d Division Hyundai Electronics Industries Co. Ltd.
-
Han Chang
Memory R&d Division Hyundai Electronics Industries Co.
-
Park Jin
R&d Division Lg Semicon. Co. Ltd.
-
Lee J
National Nano Device Lab. Hsinchu Twn
-
Lee Joo
Memory R&d Division Hyundai Electronics Industries Co.
-
PARK Ji-Soo
Memory R&D Center, Hyundai Electronics Industries Co.,Ltd.
-
Park Jin
Semiconductor R&d Goldstar Electron Co. Ltd.
-
LEE JooWan
Memory R&D Division, Hyundai Electronics Industries Co., Ltd.
-
Park Ji-soo
Memory R&d Center Hyundai Electronics Industries Co. Ltd.
-
HAN Chang
Memory R&D Center, Hyundai Electronics Industries Co.,Ltd.
-
Park Jin
Advanced Process Team Memory R&d Division Hyundai Electronics Industries Co. Ltd.
-
Park J
Hyundai Microelectronics Co. Ltd. Chungju Kor
-
Park J‐s
Hanyang Univ. Kyunggido Kor
-
Lee Joo
Memory R&d Division Hynix Semiconductor Inc.
著作論文
- Degradation of Ta_2O_5 Gate Dielectric by TiCl_4-Based Chemically Vapor Deposited TiN Film in W/TiN/Ta_2O_5/Si System
- Degradation of Ta_2O_5 Gate Dielectric by TiCl_4-Based Chemically Vapor Deposited TiN Film in W/TiN/Ta_2O_5/Si System