Homma Y | Ntt Interdisciplinary Res. Lab. Tokyo Jpn
スポンサーリンク
概要
関連著者
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Homma Y
Ntt Interdisciplinary Res. Lab. Tokyo Jpn
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HOMMA Yoshikazu
NTT Basic Research Laboratories
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OGINO Toshio
NTT Basic Research Laboratories
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HOMMA Yoshikazu
NTT Interdisciplinary Research Laboratories
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Ogino T
Ntt Basic Research Laboratories
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Homma Yoshikazu
NTT Interdisciplinary Labs., Midori-cho, Musashino 180, Japan
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HIBINO Hiroki
NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation
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Hibino H
Ntt Basic Res. Lab. Kanagawa Jpn
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Hibino Hiroki
Ntt Basic Research Laboratories
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Homma Y
Ntt Basic Res. Lab. Kanagawa Jpn
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Inoue N
National Defense Acad. Yokosuka Jpn
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Inoue N
Oki Electric Ind. Co. Ltd. Tokyo Jpn
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FINNIE Paul
NTT Basic Research Laboratories
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Finnie Paul
Ntt Basic Research Laboratories:(present Office)institute For Microstructural Sciences National Rese
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Osaka J
Ntt Photonics Lab. Atsugi Jpn
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Inoue Naohisa
Ntt Lsi Laboratories
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OSAKA Jiro
NTT LSI Laboratories
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SUMITOMO Koji
NTT Basic Research Laboratories
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TOMITA Masato
NTT Lifestyle and Enviromental Technology Laboratories, NTT Corporation
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YAMASHITA Takayuki
Departments of Hematology and Oncology, Institute of Medical Science, University of Tokyo
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Tomita M
Ntt Lifestyle And Environmental Technology Laboratories:(present Office)corning Technology Center
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Tomita Masato
Ntt Lifestyle And Enviromental Technology Laboratories Ntt Corporation
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Maruo T
Ntt Interdisciplinary Research Laboratories
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HIGASHI Yasuhiro
NTT Interdisciplinary Research Laboratories
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MARUO Tetsuya
NTT Interdisciplinary Research Laboratories
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TANAKA Tohru
NTT Interdisciplinary Research Laboratories
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Yamashita Takayuki
Department Of Orthopaedic Surgery Yokohama City University
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Yamashita Takayuki
Department Of Material Science And Technology Tokai University
著作論文
- Single-Walled Carbon Nanotube Growth on Silicon Substrates Using Nanoparticle Catalysts : Instrumentation, Measurement, and Fabrication Technology
- Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy
- Depth Profiling of As in an AlAs/GaAs Multilayer by a New Laser-Induced Sputtered Neutral Mass Spectrometry System
- Observation of Incomplete Surface Melting of Si Using Medium-Energy Ion Scattering Spectroscopy
- In Situ Observation of Surface Morphology Evolution Corresponding to Reflection High-Energy Electron Diffraction Oscillation during Molecular Beam Epitaxy of Gallium Arsenide
- Patterning-Assisted Control for Ordered Arrangement of Atomic Steps on Si(111) Surfaces
- In Situ Observation of Monolayer Steps during Molecular Beam Epitaxy of Gallium Arsenide by Scanning Electron Microscopy