YANG Jun-Mo | National Nanofab Center, Measurement & Analysis
スポンサーリンク
概要
関連著者
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YANG Jun-Mo
National Nanofab Center, Measurement & Analysis
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Yang Jun-mo
National Nanofab Center
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JUNG Seung-Boo
School of Advanced Materials Science and Engineering, Sungkyunkwan University
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HA Sang-Su
School of Advanced Materials Science & Engineering, Sungkyunkwan University
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Jung Seung-boo
School Of Advanced Materials Science & Engineering Sungkyunkwan University
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Ha Sang-su
School Of Advanced Materials Science & Engineering Sungkyunkwan University
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Jung Seung-boo
School Of Adv. Mat. Sci. & Eng. Sungkyunkwan Univ.
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Kim Joong
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Yang Jun-mo
National Nanofab Center Measurement & Analysis
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KIM Kyung-Seob
Department of Electronic Engineering, Yeojoo Institute of Technology
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Kawasaki Masahiro
Jeol Ltd.
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Kim Kyung-seob
Department Of Electronic Engineering Yeojoo Institute Of Technology
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LEE Wan-Gyu
National Nanofab Center
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Kawasaki Masahiro
Jeol Ltd
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Kim Joong
Institute Of Molecular Biology And Genetics And Department Of Molecular Biology Seoul National Unive
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Kim Joong
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
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Kawasaki Masahiro
JEOL Co. Ltd
著作論文
- Electromigration Behavior of through-Si-via (TSV) Interconnect for 3-D Flip Chip Packaging
- High-resolution transmission electron microscopy and electron energy-loss spectroscopy study of polycrystalline-Si/ZrO_2/SiO_2/Si metal-oxide-semiconductor structures