Annealing Effect on the Microstructure and Optical Characterization of Zn₂SiO₄ Thin Film Sputtered on Quartz Glass (Special Issue : Advanced Plasma Science and Its Applications for Nitrides and Nanomaterials)
スポンサーリンク
概要
著者
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Liu Shiu-jen
Department Of Elctrophysics National Chiao Tung University
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Peng Kun-Cheng
Department of Materials Engineering, Ming Chi University of Technology, New Taipei City 24301, Taiwan
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Kao Hao-Che
Department of Materials Engineering, Ming Chi University of Technology, New Taipei City 24301, Taiwan
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Tsai Kuei-Lan
St. Mary's Nursing and Management College, Sanxing, Yilan 26644, Taiwan
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Lin Jing-Chie
Institute of Material Science and Engineering, National Central University, Jhongli, Taoyuan 32001, Taiwan
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- Annealing Effect on the Microstructure and Optical Characterization of Zn₂SiO₄ Thin Film Sputtered on Quartz Glass (Special Issue : Advanced Plasma Science and Its Applications for Nitrides and Nanomaterials)
- Growth and Transport Properties of (110)-Oriented La2/3Sr1/3MnO3 Thin Films on TiO2-Buffered Si (100) Substrates