High-Resolution Transmission Electron Microscopy of Planar Defects in Ca-Doped YBCO/(1-2-4) High-Tc Superconductors Y1-xCaxBa2Cu4Oy(x=0 to 0.1) (High Technology Materials-3-<Special Issue>)
スポンサーリンク
概要
著者
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Matsui Yoshio
Advanced Electron Microscopy Group National Institute For Materials Science (nims)
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Matsui Yoshio
Advance Materials Laboratory National Institute For Materials Science
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