High-Resolution Transmission Electron Microscopy of Modulated Structures and Defects in Bi-Sr-Ca-Cu-O Superconductors Prepared by Various Procedures
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概要
著者
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Matsui Yoshio
Advanced Electron Microscopy Group National Institute For Materials Science (nims)
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Matsui Yoshio
Advance Materials Laboratory National Institute For Materials Science
関連論文
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