Grain Boundary Analysis of Silicon Nitrides by 400kV Analytical Electron Microscopy
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概要
著者
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Bando Y
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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Bando Yoshio
International Center For Materials Nanoarchitectonics National Institute For Materials Science (nims
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Bando Yoshio
Advanced Materials Laboratory And Nanomaterials Laboratory National Institute For Materials Science
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Bando Yoshio
Advanced Materials Laboratory National Institute For Materials Science
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