Bulk Sensitive Soft X-ray Angle-Resolved Photoemission Spectroscopy of Bi1.72Pb0.38Sr1.88CuO6+δ
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概要
- 論文の詳細を見る
Electronic structure of heavily over-doped Bi1.72Pb0.38Sr1.88CuO6+δ (Bi2201) superconductor was investigated by using the angle-resolved photoemission spectroscopy with soft x-ray as the incident photon source (SX-ARPES), which is known as one of the best bulk sensitive experimental techniques to investigate the electronic structure. By using the Cu 2p–3d resonance condition, we succeeded in determining the energy–momentum dispersion near the Fermi level and the Fermi surface. It is clearly shown that both SX- and VUV-ARPES are capable of determining the energy–momentum dispersion near $\varepsilon_{\text{F}}$ at least for the homologous series of Bi2Sr2CanCun+1O6+2n+δ cuprate superconductors, and that the combinational use of SX- and VUV-ARPES is one of the best experimental methods to determine the electronic structure of bulk materials.
- Physical Society of Japanの論文
- 2010-06-15
著者
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Ikuta Hiroshi
Department Of Applied Physics The University Of Tokyo
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Takeuchi Tsunehiro
Department Of Applied Physics Nagoya University
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Hiroshi Ikuta
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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Shin-ichi Fujimori
Synchrotron Radiation Research Center, Japan Atomic Energy Agency, SPring-8, Sayo, Hyogo 679-5148, Japan
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Yoichiro Hamaya
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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Hamaya Yoichiro
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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Takuo Ohkochi
Synchrotron Radiation Research Center, Japan Atomic Energy Agency, SPring-8, Sayo, Hyogo 679-5148, Japan
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Yuji Saitoh
Synchrotron Radiation Research Center, Japan Atomic Energy Agency, SPring-8, Sayo, Hyogo 679-5148, Japan
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Tsunehiro Takeuchi
Department of Crystalline Materials Science, Graduate School of Engineering, Nagoya University, Nagoya 464-8603, Japan
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