Bit-Error-Rate-Based Evaluation of Energy-Gap-Induced Super-Resolution Read-Only-Memory Disc in Blu-ray Disc Optics
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概要
- 論文の詳細を見る
Bit error rate (bER) of an energy-gap-induced super-resolution (EG-SR) read-only-memory (ROM) disc with a zinc oxide (ZnO) film was measured in Blu-ray Disc (BD) optics by the partial response maximum likelihood (PRML) detection method. The experimental capacity was 40 GB in a single-layered 120 mm disc, which was about 1.6 times as high as the commercially available BD with 25 GB capacity. BER near $1 \times 10^{-5}$ was obtained in an EG-SR ROM disc with a tantalum (Ta) reflective film. Practically available characteristics, including readout power margin, readout cyclability, environmental resistance, tilt margins, and focus offset margin, were also confirmed in the EG-SR ROM disc with 40 GB capacity.
- 2008-07-25
著者
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Takahashi Akira
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Tajima Hideharu
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Mori Go
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Harada Yasuhiro
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Murakami Yoshiteru
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamada Hirohisa
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Hayashi Tetsuya
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamamoto Masaki
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Akiyama Jun
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Maeda Shigemi
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamada Hirohisa
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Hayashi Tetsuya
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamamoto Masaki
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Maeda Shigemi
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Akiyama Jun
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Takahashi Akira
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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