Tajima Hideharu | Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
スポンサーリンク
概要
関連著者
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Takahashi Akira
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Tajima Hideharu
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Yamamoto Masaki
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Harada Yasuhiro
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Murakami Yoshiteru
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamada Hirohisa
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Takamori Nobuyuki
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Mori Go
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Hayashi Tetsuya
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Maeda Shigemi
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamamoto Masaki
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Maeda Shigemi
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Hayashi Tetsuya
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, Tenri, Nara 632-8567, Japan
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Maeda Shigemi
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, Tenri, Nara 632-8567, Japan
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Kojima Kunio
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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TAKAHASHI Akira
Optical Disk Systems Development Center, Sharp Corporation
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TAKAMORI Nobuyuki
Optical Disk Systems Development Center. Sharp Corporation
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TAJIMA Hideharu
Optical Disk Systems Development Center. Sharp Corporation
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Takahashi Akira
Optical Disk Systems Development Center. Sharp Corporation
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Yamada Hirohisa
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Hayashi Tetsuya
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Akiyama Jun
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Takamori Nobuyuki
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Yamamoto Masaki
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, Tenri, Nara 632-8567, Japan
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Kojima Kunio
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Akiyama Jun
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Tajima Hideharu
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
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Tajima Hideharu
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, Tenri, Nara 632-8567, Japan
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Takahashi Akira
Advanced Technology Research Laboratories, Corporate R&D Group, SHARP Corporation, 2613-1 Ichinomoto-cho, Tenri, Nara 632-8567, Japan
著作論文
- Bit-Error-Rate Evaluation of Energy-Gap-Induced Super-Resolution Read-Only-Memory Disc with Dual-Layer Structure
- Stress-Balanced Design of Center Aperture Detection-Magnetic Super-Resolution (CAD-MSR) Single-Sided Disk with 0.5-mm-Thick Substrate
- Bit-Error-Rate-Based Evaluation of Energy-Gap-Induced Super-Resolution Read-Only-Memory Disc in Blu-ray Disc Optics
- Publisher’s Note: “Bit-Error-Rate Evaluation of Energy-Gap-Induced Super-Resolution Read-Only-Memory Disc with Dual-Layer Structure”
- Read Power Sensitivity in Energy-Gap-Induced Super-Resolution Read-Only-Memory Disc with Germanium Reflective Film
- Dual-Layer Energy-Gap-Induced Super-Resolution Read-Only-Memory Disc Using ZnO Film