Method for Evaluating Partial Response Maximum Likelihood System Performance Using Sequenced Amplitude Margin
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概要
- 論文の詳細を見る
- 2002-03-30
著者
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AKIYAMA Jun
Department of Materials, Physics and Energy Engineering, Nagoya University
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Akiyama Jun
Department Of Materials Physics And Energy Engineering Nagoya University
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Maeda S
Department Of Electronic Device Engineering Graduate School Of Information Science And Electrical En
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Takahashi A
Department Of Nuclear Engineering Graduate School Of Engineering Osaka University
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Takahashi Akira
Advanced Technology Research Laboratories Corporate R&d Group Sharp Corporation
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Numata Tomiyuki
Optical Disk Systems Development Center Sharp Corporation
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TAKAHASHI Akira
Optical Disk Systems Development Center, Sharp Corporation
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OKUMURA Tetsuya
Optical Disk Systems Development Center, Sharp Corporation
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AKIYAMA Jun
Optical Disk Systems Development Center, Sharp Corporation
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MAEDA Shigemi
Optical Disk Systems Development Center, Sharp Corporation
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YAMAGUCHI Takeshi
Optical Disk Systems Development Center, Sharp Corporation
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Okumura T
Optical Disk Systems Development Center Sharp Corporation
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Takahashi Akira
Optical Disk Systems Development Center. Sharp Corporation
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