Vibration Analysis of Scanning Near-Field Optical Microscope Probe Using the Timoshenko Beam Model

スポンサーリンク

概要

• 論文の詳細を見る

• The flexural vibration frequency for a scanning near-field optical microscope (SNOM) fiber probe has been derived using the Timoshenko beam theory, including the effects of shear deformation and rotary inertia, and a closed-form expression has been obtained. In the analysis, the effects of the normal contact stiffness and the ratio of different probe dimensions on the frequency were studied. The results show that increasing the ratio of probe length to radius increases the vibration frequency of mode 1. In addition, the resonant frequencies based on the Bernoulli–Euler beam theory and the Timoshenko beam theory are compared. When the contact stiffness is very large for the higher modes, the effects of shear deformation and rotary inertia on the frequency become significant. This observation that the Timoshenko beam theory is able to predict the frequencies of flexural vibrations of the higher modes with higher contact stiffness for the SNOM fiber probe.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2008-05-25

著者

• LEE Haw-Long

  Department of Mechanical Engineering, Kun Shan University

• Chang Win-jin

  Department Of Mechanical Engineering Kun Shan University Of Technology

• Chen Terry

  Department of Mechanical Engineering, National Cheng Kung University, Tainan 701, Taiwan

• Lee Haw-Long

  Department of Mechanical Engineering, Kun Shan University, Tainan 710-03, Taiwan

• Chang Win-Jin

  Department of Mechanical Engineering, Kun Shan University, Tainan 710-03, Taiwan

関連論文

• Effect of Interactive Damping on Vibration Sensitivities of V-Shaped Atomic Force Microscope Cantilevers
• Laser-Induced Thermal Effect on Sensitivity of Scanning Near-Field Optical Microscope Probe
• Transient Analysis of Two-Dimensional Pin Fins with Non-Constant Base Temperature(Heat Exchanger)
• Erratum: ``Sensitivity Analysis of a Cracked Atomic Force Microscope Cantilever''
• Sensitivity Analysis of a Cracked Atomic Force Microscope Cantilever
• Vibration Analysis of Scanning Near-Field Optical Microscope Probe Using the Timoshenko Beam Model
• Effect of Interactive Damping on Vibration Sensitivities of V-Shaped Atomic Force Microscope Cantilevers
• Thermoviscoelastic Analysis of Polymeric Film on an Elastic Substrate with Graded Interlayer
• Effects of Damping on the Vibration Frequency of Atomic Force Microscope Cantilevers Using the Timoshenko Beam Model
• Vibration analysis of a graphene-substrate structure

スポンサーリンク