Effect of Interactive Damping on Vibration Sensitivities of V-Shaped Atomic Force Microscope Cantilevers
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-07-15
著者
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LEE Haw-Long
Department of Mechanical Engineering, Kun Shan University
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YANG Yu-Ching
Department of Mechanical Engineering, Kun Shan University
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CHANG Win-Jin
Department of Mechanical Engineering, Kun Shan University
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CHU Shao-Shu
Department of Mechanical Engineering, Kun Shan University
関連論文
- Effect of Interactive Damping on Vibration Sensitivities of V-Shaped Atomic Force Microscope Cantilevers
- Laser-Induced Thermal Effect on Sensitivity of Scanning Near-Field Optical Microscope Probe
- Erratum: ``Sensitivity Analysis of a Cracked Atomic Force Microscope Cantilever''
- Sensitivity Analysis of a Cracked Atomic Force Microscope Cantilever
- Vibration Analysis of Scanning Near-Field Optical Microscope Probe Using the Timoshenko Beam Model
- Effect of Interactive Damping on Vibration Sensitivities of V-Shaped Atomic Force Microscope Cantilevers
- Thermoviscoelastic Analysis of Polymeric Film on an Elastic Substrate with Graded Interlayer
- Effects of Damping on the Vibration Frequency of Atomic Force Microscope Cantilevers Using the Timoshenko Beam Model
- Vibration analysis of a graphene-substrate structure