Sensitivity Analysis of a Cracked Atomic Force Microscope Cantilever
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概要
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The sensitivity of flexural vibration for an atomic force microscope (AFM) cantilever with a crack has been studied. An explicit expression for the sensitivity of vibration modes of the cracked cantilever has been obtained using the relationship between the resonant frequency and contact stiffness of the cantilever and sample. Results show that the sensitivities of the three modes of the cracked cantilever are higher than those of the cantilever without crack when the contact stiffness is low. When the contact stiffness is high, however, the situation is reverse. Therefore, a cracked AFM cantilever can be used for imaging soft samples such as biological molecules and polymers. In addition, the crack near the free end of cantilever that leads to a higher sensitivity. This is useful for the design of a highly sensitive cantilever.
- 2012-03-25
著者
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LEE Haw-Long
Department of Mechanical Engineering, Kun Shan University
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Chang Win-jin
Department Of Mechanical Engineering Kun Shan University Of Technology
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