Fabrication of Nano-Gap Electrode Pairs Using Atomic-Layer-Deposited Sacrificial Layer and Shadow Deposition
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概要
- 論文の詳細を見る
We propose a new fabrication process of nano-gap electrode pairs using an atomic-layer-deposited (ALD) sacrificial layer and the shadow deposition technique. In this process, gap width can be precisely controlled by the number of deposition cycles of the ALD process, whereas junction area is defined by the deposition angle of the second electrode material through an overhanging shadow mask on top of the first electrode. In comparison with our previous method, process reliability has been highly improved because the unintentional deposition of the second electrode material on the sidewall of the first electrode is completely prevented. We have fabricated $10 \times 10$ arrays of $n$-type polycrystalline silicon ($n$-poly-Si)/Au nano-gap electrode pairs with gap widths of 6 and 9 nm, which show good insulating properties at room temperature.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-05-15
著者
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PARK Chan
Electronics and Telecommunications Research Institute
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Lim Jung-wook
Electronics And Telecommunications Research Institute
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Lim Jung-Wook
Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-700, Republic of Korea
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Yu Han
Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-700, Republic of Korea
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Pi Ung
Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-700, Republic of Korea
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Ryu Min
Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-700, Republic of Korea
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Choi Sung-Yool
Electronics and Telecommunications Research Institute (ETRI), 161 Gajeong-dong, Yuseong-gu, Daejeon 305-700, Republic of Korea
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- Fabrication of Nano-Gap Electrode Pairs Using Atomic-Layer-Deposited Sacrificial Layer and Shadow Deposition