Correlation of Grain Size of Pentacene-Deposited Surface and Carbon Content Analyzed by X-ray Photoelectron Spectroscopy

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概要

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• The surfaces of SiO2 films were treated using $n$-octadecyltrichlorosilane diluted solution, their chemical properties were analyzed by X-ray photoelectron spectroscopy, and their leakage currents were determined using current–voltage ($I$–$V$) measurements. The resultant thin film was composed of Si, O, and C atoms, and Cl atoms did not participate in the chemical reaction mechanism. SiO2 films changed from having inorganic to having organic properties, according to the increasing $N$-octadecyltrichlorosilane (OTS) content. Grain size and leakage current were found to be related to the carbon content and the perpendicular generation of pentacene molecules. Grain size and leakage current decreased for the sample with the lowest carbon content. The 0.2%-OTS-treated SiO2 films with hybrid properties had decreased leakage current.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2006-10-15

著者

• Oh Teresa

  School Of Electronic And Information Engineering Cheongju University

• Oh Teresa

  School of Electronic and Information Engineering, Cheongju University, 36 Naedok-Dong Sangdang-Gu, Cheongju, Chungbuk 360-764, Korea

• Kim Hong

  School of Electronic and Information Engineering, Cheongju University, 36 Naedok-Dong Sangdang-Gu, Cheongju, Chungbuk 360-764, Korea

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