X-Ray Stress Measurement Method for Single Crystal with Unknown Stress-Free Lattice Parameter

概要

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In this study, a new principle, which can determine the stress states in a single crystal even if the lattice spacing of $d_{0}$ in the stress-free condition is unknown, was proposed. In this principle, the stress states in the plane stress condition can be determined by considering not only the stress components but also the stress-free diffraction angle of $2\theta_{0}$ as constant values in multiple regression analysis. The stress states calculated by this principle is not affected by the slight change of the predicted diffraction angle $2\theta_{0}$ which occurs due to the setting error of the specimen. Therefore, this principle can determine the plane stress condition without the effect of the reliability of $d_{0}$. High reliability of this principle was verified by carrying out the applied stress measurements of silicon single crystal.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2003-05-15