Transmission Electron Microscopy and Atomic Force Microscopy Studies of an Al–Pd–Mn Thin Film Prepared by a Combined Technique of Vacuum Deposition and Thermal Annealing
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概要
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A thin-film sample of Al–Pd–Mn ternary alloy has been produced by a vacuum deposition technique using dual evaporation sources, followed by thermal annealing. The microstructure of the film has been examined by transmission electron microscopy (TEM) and by atomic force microscopy (AFM). The TEM observations reveal that the film has a granular texture of highly ordered icosahedral phase islands embedded in the matrix consisting mainly of multiple-twinned crystals exhibiting a pseudo-tenfold symmetry. It is shown by AFM that the icosahedral islands form protuberant structures with the average height of approximately 50 nm.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2001-06-15
著者
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Saito Kaichi
Deparment Of Materials Science And Engineerling Faculty Of Engineering And Resource Science Akita Un
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Sugawara Shigeo
Deparment Of Materials Science And Engineerling Faculty Of Engineering And Resource Science Akita Un
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Edagawa Keiichi
Institute Of Industrial Science The University Of Tokyo
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Kamimura Yasushi
Institute Of Industrial Science The University Of Tokyo
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Yoneshima Masakazu
Department Of Materials Science And Engineering Faculty Of Engineering And Resource Science Akita Un
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Saito Kaichi
Department of Materials Science and Engineering, Faculty of Engineering and Resource Science, Akita University, Akita 010-8502, Japan
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Yoneshima Masakazu
Department of Materials Science and Engineering, Faculty of Engineering and Resource Science, Akita University, Akita 010-8502, Japan
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Sugawara Shigeo
Department of Materials Science and Engineering, Faculty of Engineering and Resource Science, Akita University, Akita 010-8502, Japan
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