RHEED Patterns and Surface Morphology of ZnSe Homoepitaxial Films Grown by MBE
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概要
- 論文の詳細を見る
Homoepitaxial films of ZnSe have been grown on (001)ZnSe substrates by molecular-beam epitaxy(MBE). These films were grown at a constant substrate temperature of 360°C. The Zn-beam pressure ($P_{\text{Zn}}$) was fixed, while the Se-beam pressure ($P_{\text{Se}}$) was varied. The surfaces during the growth were observed by reflection high-energy electron diffraction (RHEED). The grown film observed with a scanning electron microscope showed the smoothest surface for $P_{\text{Se}}/P_{\text{Zn}}{=}1.1$, which makes the surface a c($2\times 2$) surface structure. This suggests that the surface stoichiometry condition does not necessarily provide a smooth surface.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1989-09-20
著者
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Kawashima Mitsuo
Electronics Materials Laboratory Sumitomo Metal Mining Co Ltd.
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Menda Kazunori
Electronics Materials Laboratory Sumitomo Metal Mining Co. Ltd.
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MINATO Tetsuo
Electronics Materials Laboratory, Sumitomo Metal Mining Co., Ltd.
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Minato Tetsuo
Electronics Materials Laboratory, Sumitomo Metal Mining Co., Ltd., 1-6-1 Suehiro-cho Ohme-shi, Tokyo 198
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- Electron Velocity-Field Characteristics of Ga_xIn_Sb Measured by a Microwave Heating Technique
- Large Signal Monte Carlo Simulation of Electron Transport in Ga_xIn_Sb
- Ion Beam Analysis of ZnSe
- RHEED Patterns and Surface Morphology of ZnSe Homoepitaxial Films Grown by MBE