Demonstration of X-Ray Talbot Interferometry
スポンサーリンク
概要
- 論文の詳細を見る
First Talbot interferometry in the hard X-ray region was demonstrated using a pair of transmission gratings made by forming gold stripes on glass plates. By aligning the gratings on the optical axis of X-rays with a separation that caused the Talbot effect by the first grating, moiré fringes were produced inclining one grating slightly against the other around the optical axis. A phase object placed in front of the first grating was detected by moiré-fringe bending. Using the technique of phase-shifting interferometry, the differential phase corresponding to the phase object could also be measured. This result suggests that X-ray Talbot interferometry is a novel and simple method for phase-sensitive X-ray radiography.
- Japan Society of Applied Physicsの論文
- 2003-07-15
著者
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Momose Atsushi
Department Of Advanced Materials Science Graduate School Of Frontier Sciences The University Of Toky
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Takai Kengo
Spring-8
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Koyama Ichiro
Department Of Advanced Materials Science School Of Frontier Sciences The University Of Tokyo
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Suzuki Yoshio
Spring-8
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Momose Atsushi
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
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Kawamoto Shinya
Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
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Hamaishi Yoshitaka
Department of Applied Physics, School of Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
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Takai Kengo
SPring-8, Mikazuki, Hyogo 679-5198, Japan
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Koyama Ichiro
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, Japan
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