Microbeam of 200 keV X-ray with Sputtered-Sliced Zone Plate

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概要

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• The microfocusing of 200 keV X-rays with a sputtered-sliced zone plate (ss-FZP) was performed at the wiggler beamline (BL08W, Station A) at SPring-8. The ss-FZP used was the same as that used in the 100 keV X-ray focusing experiment previously reported. The minimum focal spot size attained for the first-order focal beam was ${\sim}5$ μm with a focal distance of 1720 mm at a photon energy of 200 keV.

• 2009-01-25

著者

• TAMURA Shigeharu

  Photonics Research Institute

• Takeuchi Akihisa

  Spring-8

• Suzuki Yoshio

  Spring-8

• Itou Masayoshi

  Spring-8 Jasri

• Itou Masayoshi

  SPring-8, Mikazuki, Hyogo 679-5198, Japan

• Kamijo Nagao

  Kansai Medical University, Hirakata, Osaka 573-1136, Japan

• Tamura Shigeharu

  Photonic Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Ikeda, Osaka 563-8577, Japan

• Takeuchi Akihisa

  SPring-8, Mikazuki, Hyogo 679-5198, Japan

関連論文

• Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit
• Diffraction-limited Microbeam with Fresnel Zone Plate Optics in Hard X-Ray Regions
• Quantitative Analysis of Trace Heavy Elements in Geological Samples Utilizing High-energy (116keV) Synchrotron Radiation X-ray Fluorescence Analysis for Forensic Investigation
• Two-Beam X-Ray Interferometer Using Prism Optics : Instrumentation, Measurement, and Fabrication Technology
• Demonstration of X-Ray Talbot Interferometry
• Microbeam of 200 keV X-ray with Sputtered-Sliced Zone Plate
• Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit
• Production of Reflection Point Sources for Hard X-Ray Gabor Holography
• Diffraction-limited Microbeam with Fresnel Zone Plate Optics in Hard X-Ray Regions
• Demonstration of X-Ray Talbot Interferometry

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