Grating-Based X-ray Phase Imaging Using Multiline X-ray Source
スポンサーリンク
概要
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Differential phase-contrast X-ray imaging has been performed in a Talbot–Lau configuration, where a multiline X-ray source was used instead of a combination of a hard-X-ray multiple slit and a normal focus X-ray generator. When the multiple slit is used, a high aspect ratio structure is needed and slit width should be below 10 μm for its function. The fabrication and use of such a multislit can be omitted using the presented configuration. The multiline X-ray source was developed by making grooves on a tungsten rotating anode, which was irradiated by an electron beam to generate X-rays. An array of 10 μm line sources with a pitch of 30 μm was formed and combined with a 4.5 μm pitch phase grating and a 5.3 μm pitch amplitude grating to generate differential phase contrast. With a total exposure time of 40 s, a differential phase image depicting cartilages was obtained.
- 2009-07-25
著者
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Momose Atsushi
Department Of Advanced Materials Science Graduate School Of Frontier Sciences The University Of Toky
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Yashiro Wataru
Department Of Advanced Materials Science Graduate School Of Frontier Sciences The University Of Toky
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Kuwabara Hiroaki
Department Of Advanced Materials Science Graduate School Of Frontier Sciences The University Of Toky
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Kawabata Katsuyuki
Department Of Applied Chemistry National Defence Academy
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Kuwabara Hiroaki
Department of Advanced Materials Science, Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan
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