Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588]

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概要

• 論文の詳細を見る
• The Institute of Electronics, Information and Communication Engineersの論文

著者

• Luo Jun

  School Of Material Eng. Soochow University

• Hao Yue

  School of Microelectronics, Xidian University

• Chen Haoran

  School of Microelectronics, Xidian University

• Liu Xiaoxian

  School of Microelectronics, Xidian University

• Zhu Zhangming

  School of Microelectronics, Xidian University

• Yang Linan

  School of Microelectronics, Xidian University

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• Erratum: The impact of trapping centers on AlGaN/GaN resonant tunneling diode [IEICE Electronics Express Vol. 10 (2013) No. 19 pp. 20130588]

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